Yuan Taur

InstitutionUniversity of California San Diego
DepartmentElectrical and Computer Engineering
Address9500 Gilman Drive #0407
La Jolla CA 92093
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    1. Kavrik MS, Thomson E, Chagarov E, Tang K, Ueda ST, Hou V, Aoki T, Kim MJ, Fruhberger B, Taur Y, McIntyre PC, Kummel AC. Ultra-Low defect density at sub-0.5 nm HfO2/SiGe interfaces via selective oxygen scavenging. ACS Appl Mater Interfaces. 2018 Aug 03. PMID: 30073827.
      View in: PubMed
    2. Nguyen BM, Taur Y, Picraux ST, Dayeh SA. Diameter-independent hole mobility in Ge/Si core/shell nanowire field effect transistors. Nano Lett. 2014 Feb 12; 14(2):585-91. PMID: 24382113.
      View in: PubMed
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