Yuan Taur

Title(s)Professor, Electrical and Computer Engineering
SchoolVc-academic Affairs
Address9500 Gilman Drive #
La Jolla CA 92093
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    Publications listed below are automatically derived from MEDLINE/PubMed and other sources, which might result in incorrect or missing publications. Researchers can login to make corrections and additions, or contact us for help. to make corrections and additions.
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    Altmetrics Details PMC Citations indicate the number of times the publication was cited by articles in PubMed Central, and the Altmetric score represents citations in news articles and social media. (Note that publications are often cited in additional ways that are not shown here.) Fields are based on how the National Library of Medicine (NLM) classifies the publication's journal and might not represent the specific topic of the publication. Translation tags are based on the publication type and the MeSH terms NLM assigns to the publication. Some publications (especially newer ones and publications not in PubMed) might not yet be assigned Field or Translation tags.) Click a Field or Translation tag to filter the publications.
    1. Understanding the Mechanism of Electronic Defect Suppression Enabled by Nonidealities in Atomic Layer Deposition. J Am Chem Soc. 2020 Jan 08; 142(1):134-145. Kavrik MS, Bostwick A, Rotenberg E, Tang K, Thomson E, Aoki T, Fruhberger B, Taur Y, McIntyre PC, Kummel AC. PMID: 31779305.
      View in: PubMed   Mentions: 1     Fields:    
    2. Engineering High- k/SiGe Interface with ALD Oxide for Selective GeO x Reduction. ACS Appl Mater Interfaces. 2019 Apr 24; 11(16):15111-15121. Kavrik MS, Ercius P, Cheung J, Tang K, Wang Q, Fruhberger B, Kim M, Taur Y, McIntyre PC, Kummel AC. PMID: 30938163.
      View in: PubMed   Mentions: 1     Fields:    
    3. Ultralow Defect Density at Sub-0.5 nm HfO2/SiGe Interfaces via Selective Oxygen Scavenging. ACS Appl Mater Interfaces. 2018 Sep 12; 10(36):30794-30802. Kavrik MS, Thomson E, Chagarov E, Tang K, Ueda ST, Hou V, Aoki T, Kim M, Fruhberger B, Taur Y, McIntyre PC, Kummel AC. PMID: 30073827.
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    4. Diameter-independent hole mobility in Ge/Si core/shell nanowire field effect transistors. Nano Lett. 2014 Feb 12; 14(2):585-91. Nguyen BM, Taur Y, Picraux ST, Dayeh SA. PMID: 24382113.
      View in: PubMed   Mentions: 7     Fields:    
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